Design for Testability tutorials & labs.

Design for Testability, from why manufacturing test exists to a full scan + compression + ATPG signoff. Beginner-to-advanced and production-test aware: understand fault models and testability, insert and verify scan, reason about ATPG controllability and observability, add MBIST/LBIST and boundary scan, and — most of all — learn to debug the coverage loss and scan-chain failures that decide whether silicon ships.